The Nanosurf Scanning Tunneling Microscope is an easy to use instrument with which you can achieve down to atomic resolution of the surface of conducting samples, in air. It is a probe microscope that measures tunneling currents between the sample and the tip. It is mainly used with clean Au and graphite samples in student labs.

Sample Specification:

Only conducting samples. Maximum sample diameter 10 mm, but no limitations in thickness. The maximum scan range of this STM is 500 nm, and 200 nm in Z-direction.